NCTS Workshop on Industrial Statistics and Its Applications
26-27, 2012

Group photo

The field of industrial statistics is broad, both in theory and in application. In this workshop, we invite 12 outstanding researchers of various fields and focus on frontier research topics of Data Mining, DOE, Reliability, and SPC. The main goal of this workshop is to share interesting research topics and exchange research experience with colleagues in the industrial statistics research group (ISRG) at NCTS.


The speakers and the title of their talks are listed as follows:

¡EBarry C. Arnold (Department of Statistics, UC Riverside, USA)
    On Some Bivariate Lifetime Models with Given Conditional Failure Rate   Structure.
¡EYing Hung (Department of Statistics, Rutgers University, USA)
    A New Method for Developing Metamodels.
¡EYi-Li Hong (Department of Statistics, Virginia Tech., USA)
    Photo-degradation Path Modeling and Analysis with Non-linear Mixed Models.  
¡ESeoung Bum Kim (School of Industrial Management Engineering, Korea University, Korea)
    Recent Trends in Data Mining.
¡EShuen-Lin Jeng (Department of Statistics, Cheng Kung University,  Taiwan)
    Accelerated Destructive Degradation Tests Robust to Distribution Misspecification. 
¡EDennis K. J. Lin (Department of Statistics, Penn State University, USA)
    Dimensional Analysis and Statistics. 
¡ERegina Liu (Department of Statistics, Rutgers University, USA)
    An Exact Meta-analysis Approach and Its Applications to Binary Experiments with Rare Events.
¡EWilliam Q. Meeker (Department of Statistics, Iowa State University, USA)
    Methods for Planning Accelerated Repeated Measures Degradation Tests.  
¡EJyh-Jen Horng Shiau (Institute of Statistics, National Chiao Tung University, Taiwan)
    Nonparametric Monotone Regression for Generalized Linear Models with Applications to Wafer Acceptance Tests.
¡EKaibo Wang (Department of Industrial Engineering, Tsinghua University, China)
    A Spatial Variable Selection Method for Monitoring Product Surface in Semiconductor Manufacturing.
¡EDavid Shan Hill Wong (Department of Chemical Engineering, Tsing Hua University,  Taiwan)
    Run-to-run Control in a Mixed Product Manufacturing Environment with Variable Metrology Delay.
¡EArthur B. Yeh (Department of Applied Statistics and Operations Research, Bowling Green State University, USA)
    A Distribution-Free Phase-I Control Chart for Individual Observations Based on Empirical Likelihood Ratio. 




Sheng-Tsaing Tseng (National Tsing Hua University,
Shuen-Lin Jeng (National Cheng-Kung Univesity, 

Place: NCTS, 4th  Floor, The 3rd General Building, National Tsing-Hua University, Hsinchu, Taiwan


Vickey Sun

Wendy Huang

Mathematics Division 


Practical information

 ¡PVisa: Most visitors could get landing visa or visa exemption for 30 days. For general information, see visa-info. Speakers who hold the  People's Republic of China passport are requested to send their personal data (including tel number, fax number, mailing address, e- mail address and research field etc.) to secretary Wendy Huang by email at It normally takes around two/three months to process the applications of Taiwanese entrance visa for applicants from the Mainland China.

 ¡POffices: (Shared) offices will be provided to all invited speakers, with computers Windows XP.

 ¡PTourism: The link to Tourism Bureau contains maps, travel tips, attractions, etc... .